System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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HEV / EV / Grid Emulators and Test Systems
With Scienlab test systems and test software, Keysight offers customized test environments for the development and testing of electronic components according to hybrid and electric vehicle testing standards. Our solutions help you to accelerate your e-mobility applications from the battery, Battery Management System (BMS), inverter, the charging interfaces of Electric Vehicle (EV), and Electric Vehicle Supply Equipment (EVSE).
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Obsolete ATE, Replacement Systems
No one likes saying goodbye to a faithful old friend but now that the economy is on the up, has the time finally come to replace your ageing Automatic Test Equipment (ATE) or Special to Type test system?
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Power System Simulator
F6150sv
This power system simulator performs the simplest through the most complex tests. The F6150sv has the highest output current of any test set on the market – all within a single box.
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Software
DIGITIZER
The Digitizer allows the recovery of design data of unknown assemblies by an electrical analysis with a Condor flying probe test system
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PXI 5W Programmable Resistor Module, 1-Channel, 2Ω to 26.7kΩ
40-252-132
The 40-252-132 is a programmable resistor module with 1 channel which can be set between 2Ω and 26.7kΩ with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Battery and Alternator Analyser for 12V DC Systems
1176
Checks battery charge level and alternator output level. 880mm of insulated cable with test probe and earth (crocodile) clip. For 12V DC systems only. Display packed.Warning: For testing DC circuits on vehicles within the voltage range only. Not suitable for testing mains supply AC circuits.
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High-Speed Memory Test Solution
UltraFLEX-M
The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Cabling Certification
Versiv family
The Versiv family accelerates every step of the certification process. Future-ready design supports copper certification, fiber loss, OTDR testing and hardware upgrades. The revolutionary ProjX management system and Taptive user interface ensures jobs are done right the first time. Analyze test results and create professional test reports using LinkWare management software.
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Capacitance & Tan-Delta Test System
TD-1
By measuring the electrical properties such as capacitance and Tan-Delta regularly on periodical basis, it is possible to ensure the operational unexpected breakdown. Dissipation factor (Tan Delta) is one of the most powerful off-line nondestructive diagnostic tool to monitor the condition of solid insulation of various high voltage equipment.
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Compute Express Link (CXL)
Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.
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Insulation Multimeter Series
Insulation Multimeter is a new category of test tool that combines a full featured True-rms DMM and a megohmme- ter. It's an integrated tool for maintaining and troubleshooting motor systems, electrical distribu- tion, and production equipment.
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Vacuum Inspection
INDEC
INDEC vacuum test systems monitor a wide range of containers during the production process, including bottles, jars and cans, by measuring the cap panel concavity of their closures which is dependent on the vacuum inside. This non-contact inspection reliably identifies defective containers for automatic rejection.
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In-Circuit Tester
Sparrow MTS 30
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Vibration Test Chamber Gantry Frame System
Guangdong Test EQ Equipment co., Ltd.
- Structural Design: Monolithic construction with seamless TIG welding for durability and aesthetics. Lever-driven door lock mechanism.- Smart Control System: Features a Chinese/English-language color LCD touchscreen HMI + high-performance PLC, powered by TESTEQ's proprietary software for automated, intelligent, and user-friendly operation.- Energy Efficiency: Incorporates TESTEQ's patented "Static Balance" technology, reducing energy consumption by over 30% during low-temperature stabilization....show more -
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Radar Test System
UTP 5065
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Noise Sources
WGNS
The system allows the user to extend the frequency range of the NFA to allow for accurate noise figure measurements to be performed on a device operating in the 26.5 – 170GHz range on wafer as well as in benchtop applications. Farran offers the WGNS series of noise sources to be used in conjunction with the FBC down converters for use as frequency extenders for noise figure measurement test system.
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PXI High Density Precision Resistor Module, 6-Channel, 4Ω to 5.82MΩ
40-298-052
The 40-298-052 is a high density programmable resistor module with 6 channels which can be set between 4Ω and 5.82MΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Low Voltage Burn-in and Test System
Max 450
For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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SystemSolutions
Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your yourdevice, not on your test system.
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Microwave Measurements & VNA Calibrations
Rosenberger Hochfrequenztechnik GmbH & Co. KG
For microwave measurements and VNA calibrations, Rosenberger develops, manufactures, and provides test & measurement products which meet the highest demands of industrial test applications. These include high-performance VNA test cableswith outstanding phase and amplitude stability, a variety of test port adaptors for VNA applications up to 110 GHz, very robust interchangeable high mating cycle port connector systems, and test devices – from low-frequency devices for simple measurements to components permitting high-precision broadband measurements.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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PXI/PXIe MEMS RF Multiplexer, Quad 4-Channel, 4GHz, 50Ω, SMB
40-878-241
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Integrated Optical Modulation Analyzer
N4392A
The new Keysight N4392A is an ultra-compact, portable fully integrated optical modulation analyzer with a 15'' laptop-size screen. It is optimized for daily R&D work and designed for the most affordable performance verification in manufacturing and component test for 40/100G components, modules and systems. It is the first optical modulation analyzer that provides built-in performance verification and recalibration, extending the factory recalibration cycles significantly.
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PCI Precision Resistor Card 4-Channel, 1.5Ω To 3.55kΩ
50-297-123
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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CATR Benchtop Antenna Test System
ATS800B
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Instrument Transformer Test Systems
Our systems for testing voltage (VT) and current (CT) instrument transformers are conceived among other things for testing accuracy and insulation.
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Electrostatic Discharge Generator
SKS-0230I
Shanghai Sanki Electronic Industries Co., Ltd.
The electrostatic discharge generator SKS-0230I has high reliability, the host itself can withstand 30kV electrostatic discharge test; 7-inch touch LCD screen, simple interface, convenient operation; unique combination test mechanism, multiple modes, arbitrary combinations of parameters, continuous testing; Equipped with a file management system, which can save commonly used test parameters, and can also import and export test parameters through U disk; has temperature and humidity monitoring fu...show more -
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MPI Fully Automatic Probe Systems
MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
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Pneumatic Test Adapter
Pneumatic test adapters from INGUN are particularly suitable for contacting medium-sized electronic assemblies (series testing) and a large number of variants. The test adapters are designed as a replacement kit system, are connected to an existing test system and operated with replacement kits that are specially designed for the electronic assembly to be tested.
